The new RIFD production standard at the Labelexpo Asia 2025

At Labelexpo ASIA 2025, CISC Semiconductor will showcases several times with globally leading manufacturers in the RFID industry, its innovative solutions designed to boost the productivity and quality of RAIN and NFC inlay and label production.

With 25 years expertise in RFID technology and a commitment to precision engineering, CISC delivers advanced solutions that enable manufacturers to optimize quality and performance at every stage of the production process. Key innovations include CISC’s state-of-the-art RFID Xplorer Inline production tester tools, which provide unmatched testing accuracy, speed, and real-time analytics for quality assurance, encoding, and process control. These tools empower manufacturers to identify and eliminate defects early, ensure compliance with RAIN standards, personalization, and achieve higher yield rates.

Maximising your production potential 

The Xplorer Inline system is built for extremely ultra-high throughput – processing RFID tags within milliseconds. While the system can operate at virtually any speed, real-world production is shaped by external parameters beyond the Xplorer itself. Setup your individual system for Quality Assurance, Encoding and Encrypting for RAIN & NFC. Visit CISC at their booth T22.

Explore live showcases from the partners 
Company: Mühlbauer 
Showcase: Chip Attach & Converting
RFID Quality Inspection: CISC RAIN Xplorer Inline
Booth: C85